JPS6241428B2 - - Google Patents

Info

Publication number
JPS6241428B2
JPS6241428B2 JP54146668A JP14666879A JPS6241428B2 JP S6241428 B2 JPS6241428 B2 JP S6241428B2 JP 54146668 A JP54146668 A JP 54146668A JP 14666879 A JP14666879 A JP 14666879A JP S6241428 B2 JPS6241428 B2 JP S6241428B2
Authority
JP
Japan
Prior art keywords
region
drain
voltage
gate
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54146668A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5670662A (en
Inventor
Toshuki Suzuki
Hiroshi Sakuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP14666879A priority Critical patent/JPS5670662A/ja
Priority to US06/195,683 priority patent/US4394674A/en
Publication of JPS5670662A publication Critical patent/JPS5670662A/ja
Publication of JPS6241428B2 publication Critical patent/JPS6241428B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/351Substrate regions of field-effect devices
    • H10D62/357Substrate regions of field-effect devices of FETs
    • H10D62/364Substrate regions of field-effect devices of FETs of IGFETs
    • H10D62/378Contact regions to the substrate regions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP14666879A 1979-10-09 1979-11-13 Insulated gate type field effect transistor Granted JPS5670662A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP14666879A JPS5670662A (en) 1979-11-13 1979-11-13 Insulated gate type field effect transistor
US06/195,683 US4394674A (en) 1979-10-09 1980-10-09 Insulated gate field effect transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14666879A JPS5670662A (en) 1979-11-13 1979-11-13 Insulated gate type field effect transistor

Publications (2)

Publication Number Publication Date
JPS5670662A JPS5670662A (en) 1981-06-12
JPS6241428B2 true JPS6241428B2 (en]) 1987-09-02

Family

ID=15412907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14666879A Granted JPS5670662A (en) 1979-10-09 1979-11-13 Insulated gate type field effect transistor

Country Status (1)

Country Link
JP (1) JPS5670662A (en])

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4587713A (en) * 1984-02-22 1986-05-13 Rca Corporation Method for making vertical MOSFET with reduced bipolar effects
US5386136A (en) * 1991-05-06 1995-01-31 Siliconix Incorporated Lightly-doped drain MOSFET with improved breakdown characteristics
US5374843A (en) * 1991-05-06 1994-12-20 Silinconix, Inc. Lightly-doped drain MOSFET with improved breakdown characteristics
DE69225552T2 (de) * 1991-10-15 1999-01-07 Texas Instruments Inc., Dallas, Tex. Lateraler doppel-diffundierter MOS-Transistor und Verfahren zu seiner Herstellung
JP2004335990A (ja) 2003-03-10 2004-11-25 Fuji Electric Device Technology Co Ltd Mis型半導体装置
JP5560812B2 (ja) * 2010-03-23 2014-07-30 富士通セミコンダクター株式会社 半導体装置及びその製造方法

Also Published As

Publication number Publication date
JPS5670662A (en) 1981-06-12

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